UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

BSI - BS EN ISO 25178-603

Geometrical product specifications (GPS) — Surface texture: Areal Part 603: Nominal characteristics of noncontact (phase-shifting interferometric microscopy) instruments

active, Most Current
Buy Now
Organization: BSI
Publication Date: 31 October 2013
Status: active
Page Count: 40
ICS Code (Properties of surfaces): 17.040.20
ICS Code (Geometrical Product Specification (GPS)): 17.040.40

Document History

23/30463657 DC
October 23, 2023
Draft BS EN ISO 25178-603 Geometrical product specifications (GPS) - Surface texture: Areal. Part 603: Design and characteristics of non-contact (phase shifting interferometry) instruments
A description is not available for this item.
BS EN ISO 25178-603
October 31, 2013
Geometrical product specifications (GPS) — Surface texture: Areal Part 603: Nominal characteristics of noncontact (phase-shifting interferometric microscopy) instruments
A description is not available for this item.

References

This document references:
ISO/IEC GUIDE 99 - International vocabulary of metrology - Basic and general concepts and associated terms (VIM)
Published by ISO on January 1, 2007
In this Vocabulary, a set of definitions and associated terms is given, in English and French, for a system of basic and general concepts used in metrology, together with concept diagrams to...
This document references:
ASME B46.1 - Surface Texture (Surface Roughness, Waviness, and Lay)
Published by ASME on January 1, 2019
This Standard is concerned with the geometric irregularities of surfaces. It defines surface texture and its constituents: roughness, waviness, and lay. It also defines parameters for specifying...
This document references:
ISO 10934-2 - Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy
Published by ISO on March 1, 2007
A description is not available for this item.
This document references:
ISO/IEC GUIDE 99 - International vocabulary of metrology - Basic and general concepts and associated terms (VIM)
Published by ISO on January 1, 2007
In this Vocabulary, a set of definitions and associated terms is given, in English and French, for a system of basic and general concepts used in metrology, together with concept diagrams to...
View Less
View All
Advertisement