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JEDEC JESD 313

Conduction Cooled Power Transistors, Thermal Resistance Measurements of

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Organization: JEDEC
Publication Date: 1 October 1975
Status: active
Page Count: 18
scope:

This standard provides a test method for measuring thermal resistance for conduction cooled power transistors.

Document History

JEDEC JESD 313
October 1, 1975
Conduction Cooled Power Transistors, Thermal Resistance Measurements of
This standard provides a test method for measuring thermal resistance for conduction cooled power transistors.

References

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