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IEC 60749-36

Semiconductor devices Mechanical and climatic test methods Part 36: Acceleration, steady state

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Organization: IEC
Publication Date: 1 February 2003
Status: active
Page Count: 16
ICS Code (Semiconductor devices in general): 31.080.01

Document History

IEC 60749-36
February 1, 2003
Semiconductor devices Mechanical and climatic test methods Part 36: Acceleration, steady state
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References

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