IEC 60749-16
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 16: Particle Impact Noise Detection (PIND)
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| Organization: | IEC |
| Publication Date: | 1 January 2003 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
IEC 60749-16
January 1, 2003
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 16: Particle Impact Noise Detection (PIND)
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