CENELEC - EN 60749-36
Semiconductor devices Mechanical and climatic test methods Part 36: Acceleration, steady state
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 April 2003 |
| Status: | active |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
EN 60749-36
April 1, 2003
Semiconductor devices Mechanical and climatic test methods Part 36: Acceleration, steady state
A description is not available for this item.