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NPFC - MIL-S-19500/60

SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, TYPE JAN-2N526

active, Most Current
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Organization: NPFC
Publication Date: 19 March 1970
Status: active
Page Count: 9
scope:

This specification covers the detail requirements for a PNP, germanium, low-power transistor.

See figure 1 (TO-5).

Document History

MIL-S-19500/60E VALID NOTICE 4
June 7, 2021
Semiconductor Device, Transistor, PNP, Germanium, Type JAN-2N526
A description is not available for this item.
MIL-S-19500/60
July 13, 2011
Semiconductor Device, Transistor, PNP, Germanium, Type JAN-2N526
A description is not available for this item.
MIL-S-19500/60
March 26, 2004
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, TYPE JAN-2N526
A description is not available for this item.
MIL-PRF-19500/60E NOTICE 1
June 7, 1999
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, TYPE JAN-2N526
A description is not available for this item.
MIL-S-19500/60
March 19, 1970
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, TYPE JAN-2N526
This specification covers the detail requirements for a PNP, germanium, low-power transistor. See figure 1 (TO-5).
MIL-S-19500/60
March 28, 1963
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, TYPE JAN-2N526
A description is not available for this item.
MIL-S-19500/60
June 29, 1959
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, TYPE JAN-2N526
A description is not available for this item.
MIL-S-19500/60
April 8, 1959
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, TYPE JAN-2N526
A description is not available for this item.
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References

This document references:
MIL-PRF-19500R - SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
Published by DLA on July 24, 2021
Scope. This specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process...
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
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