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JEDEC JESD 531

Thermal Resistance Test Method for Signal and Regulator Diodes (Forward Voltage, Switching Method)

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Organization: JEDEC
Publication Date: 1 July 1986
Status: active
Page Count: 21
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This standard describes a test method for measuring the thermal resistance of signal and regulator diodes. The need for modification of this test method arose out of the limited description that existed earlier for both signal and regulator diode applications in testing for thermal resistance. Previously published as ID-13. ANSI/EIA-531-1986 (July) expired June 1996. Became JESD531 after reaffirmation April 2002.

Document History

JEDEC JESD 531
July 1, 1986
Thermal Resistance Test Method for Signal and Regulator Diodes (Forward Voltage, Switching Method)
This standard describes a test method for measuring the thermal resistance of signal and regulator diodes. The need for modification of this test method arose out of the limited description that...
531
January 1, 1986
Thermal Resistance Test Method for Signal and Regulator Diodes (Forward Voltage, Switching Method)
A description is not available for this item.

References

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