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JEDEC JEP 138

User Guidelines for IR Thermal Imaging Determination of Die Temperature

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Organization: JEDEC
Publication Date: 1 September 1999
Status: active
Page Count: 10
scope:

The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance. 

Document History

JEDEC JEP 138
September 1, 1999
User Guidelines for IR Thermal Imaging Determination of Die Temperature
The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as...

References

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