JEDEC JEP 138
User Guidelines for IR Thermal Imaging Determination of Die Temperature
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| Organization: | JEDEC |
| Publication Date: | 1 September 1999 |
| Status: | active |
| Page Count: | 10 |
scope:
The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.
Document History
JEDEC JEP 138
September 1, 1999
User Guidelines for IR Thermal Imaging Determination of Die Temperature
The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as...
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