JEDEC JESD 38
Standard for Failure Analysis Report Format
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| Organization: | JEDEC |
| Publication Date: | 1 December 1995 |
| Status: | active |
| Page Count: | 12 |
scope:
This standard is to promote unification of content and format of semiconductor device failure-analysis reports so that reports from diverse laboratories may be easily read, compared, and understood by customers. Additional objectives are to ensure that reports can be easily ready by users, satisfactorily reproduced on copying machines, adequately transmitted by telefax, and conveniently stored in standard filing cabinets.
Document History
JEDEC JESD 38
December 1, 1995
Standard for Failure Analysis Report Format
This standard is to promote unification of content and format of semiconductor device failure-analysis reports so that reports from diverse laboratories may be easily read, compared, and understood...
References
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