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BSI - BS IEC 60748-23-1

Semiconductor Devices - Integrated Circuits - Part 23-1: Hybrid Integrated Circuits and Film Structures - Manufacturing Line Certification - Generic Specification

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Organization: BSI
Publication Date: 7 June 2002
Status: active
Page Count: 88
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS IEC 60748-23-1
June 7, 2002
Semiconductor Devices - Integrated Circuits - Part 23-1: Hybrid Integrated Circuits and Film Structures - Manufacturing Line Certification - Generic Specification
A description is not available for this item.

References

This document references:
IEC 60748-23-3 - Semiconductor Devices - Integrated Circuits - Part 23-3: Hybrid Integrated Circuits and Film Structures - Manufacturing Line Certification - Manufacturers´ Self-Audit Checklist and Report
Published by IEC on May 1, 2002
A description is not available for this item.
This document references:
IEC 60068-2-1 - Environmental testing – Part 2-1: Tests – Test A: Cold
Published by IEC on March 1, 2007
Introduction General This publication deals with cold tests appliable both to non heat-dissipating and heat-disspating specimens. for no heat-disspating specimens, Tests Aa and Ab do not deviate...
This document references:
IEC 60068-2-7 - Amendment 1 - Basic environmental testing procedures – Part 2-7: Tests – Test Ga and guidance: Acceleration, steady state
Published by IEC on June 1, 1986
To prove the structural suitability equipment and other electrotechnical when subjected to forces produced and the satisfactory performance of components, products, hereinafter referred to as...
This document references:
IEC 60747-1 - Semiconductor devices – Part 1: General
Published by IEC on August 1, 2010
This part of IEC 60747 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A).
This document references:
IEC 60068-2-27 - Environmental testing – Part 2-27: Tests – Test Ea and guidance: Shock
Published by IEC on February 1, 2008
Object To provide a standard procedure for determining the ability of a specimen to withstand specified severities of shock.
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