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BSI - BS CECC 17001

Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Mercury wetted make contact units for general application

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Organization: BSI
Publication Date: 15 August 1984
Status: active
Page Count: 22
ICS Code (Relays): 29.120.70

Document History

BS CECC 17001
August 15, 1984
Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Mercury wetted make contact units for general application
A description is not available for this item.

References

This document references:
BS 6001-3 - Sampling procedures for inspection by attributes Part 3: Skip-lot sampling procedures
Published by BSI on June 23, 2005
A description is not available for this item.
This document references:
BS 6001-4 - Sampling procedures for inspection by attributes - Part 4: System of sequential sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection
Published by BSI on August 4, 2005
A description is not available for this item.
This document references:
BS 6001-5 - Sampling procedures for inspection by attributes Part 5: Procedures for assessment of declared quality levels
Published by BSI on November 1, 2002
A description is not available for this item.
This document references:
BS CECC 19000 - Dry Reed Make Contact Units: Generic Specification
Published by BSI on February 28, 1979
Terminology, quality assessment, test and measurement procedures, preferred values, and rules for drafting detail specifications.
This document references:
BS 9000-2 - General Requirements for a System for Electronic Components of Assessed Quality Part 2: Specification for the National Implementation of the CECC System
Published by BSI on May 15, 1996
A description is not available for this item.
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