IPC - TM-650 2.2.16.1
Artwork Master Evaluation by Overlay
inactive, Most Current
| Organization: | IPC |
| Publication Date: | 1 December 1987 |
| Status: | inactive |
| Page Count: | 1 |
scope:
This test method is used to evaluate 1:1 artwork masters for layer to layer registration, conductor to edge spacing, screened nomenclature positioning, and solder mask to conductor relationships.
Document History
TM-650 2.2.16.1
December 1, 1987
Artwork Master Evaluation by Overlay
This test method is used to evaluate 1:1 artwork masters for layer to layer registration, conductor to edge spacing, screened nomenclature positioning, and solder mask to conductor relationships.