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JEDEC JESD 85

Methods for Calculating Failure Rates in Units of FITs

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Organization: JEDEC
Publication Date: 1 July 2001
Status: active
Page Count: 30
scope:

This standard establishes methods for calculating failure rates in units of FITs by using data in varying degrees of detail such that results can be obtained from almost any data set. The objective is to provide a reference to the way failure rates are calculated.

Document History

JEDEC JESD 85
July 1, 2001
Methods for Calculating Failure Rates in Units of FITs
This standard establishes methods for calculating failure rates in units of FITs by using data in varying degrees of detail such that results can be obtained from almost any data set. The objective...

References

This document is referenced by:
JEDEC JESD 91 - Method for Developing Acceleration Models for Electronic Component Failure Mechanisms
Published by JEDEC on August 1, 2003
The method described in this document applies to all reliability mechanisms associated with electronic components. The purpose of this standard is to provide a reference for developing acceleration...
This document is referenced by:
IEC TS 62686-1 - Process management for avionics – Electronic components for aerospace, defence and high performance (ADHP) applications – Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Published by IEC on April 1, 2020
This part of IEC 62686, which is a Technical Specification, defines the minimum requirements for general purpose "off the shelf" COTS (commercial off-the-shelf) integrated circuits and discrete...
This document is referenced by:
JEDEC JEP 150 - Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface-Mount Components
Published by JEDEC on June 1, 2013
This publication contains a set of frequently recommended and accepted JEDEC reliability stress tests. These tests are used for qualifying new and modified technology/ process/ product families, as...
This document is referenced by:
JEDEC JESD 88 - JEDEC Dictionary of Terms for Solid State Technology
Published by JEDEC on July 1, 2007
Each term and definition in this dictionary has been included strictly for application within the solid-state industry. Many of the terms and definitions in this dictionary may have applicability...
This document is referenced by:
IEC 62506 - Methods for product accelerated testing
Published by IEC on June 1, 2013
This International Standard provides guidance on the application of various accelerated test techniques for measurement or improvement of product reliability. Identification of potential failure...
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