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JEDEC JEP 134

Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis

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Organization: JEDEC
Publication Date: 1 September 1998
Status: active
Page Count: 14
scope:

The purpose of this Guideline is to provide a vehicle for acquiring and transmitting the necessary information in a concise, organized, and consistent format. Included in the Guideline is a sample form that facilitates transferring the maximum amount of background data to the failure analyst in a readily interpretable format. Immediate availability of this key information assists that analyst in completing a timely and accurate failure analysis. 

Document History

JEDEC JEP 134
September 1, 1998
Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis
The purpose of this Guideline is to provide a vehicle for acquiring and transmitting the necessary information in a concise, organized, and consistent format. Included in the Guideline is a sample...

References

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