scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 54FCT480 High-speed, dual 8-bit parity generator/checker, TTL compatible inputs 02 54FCT480A High-speed, dual 8-bit parity generator/checker, TTL compatible inputs 03 54FCT480B High-speed, dual 8-bit parity generator/checker, TTL compatible inputs

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

For device classes M, B, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.

Outline letter Case outline L D-9 (24-lead, 1.280" × .310" × .200"), dual-in-line package

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range (V_CC) 1/ - - - - - - - −0.5 V dc to +7.0 V dc DC input voltage range 2/ - - - - - - - - - - −0.5 V dc to V_CC + 0.5 V dc DC output voltage range 2/- - - - - - - - - - −0.5 V dc to V_CC + 0.5 V dc DC input diode current (I_IK) - - - - - - - - −20 mA DC output diode current (per pin) (I_OK) - - - −50 mA DC output source or sink current - - - - - - ±100 mA DC V_CC or GND current - - - - - - - - - - - - ±100 mA Storage temperature range - - - - - - - - - - −65°C to +150°C Maximum power dissipation (P_D) 3/ - - - - - - 500 mW Lead temperature (soldering, 10 seconds)- - - +300°C Thermal resistance, junction-to-case (Θ_JC)- - See MIL-M-38510, appendix C Junction temperature (T_J) - - - - - - - - - - +175°C

Supply voltage range (V_CC) - - - - - - - - - +4.5 V dc to +5.5 V dc Input low voltage range (V_IL) - - - - - - - - 0.8 V dc Input high voltage range (V_IH) - - - - - - - - 2.0 V dc Case operating temperature range (T_C)- - - - - −55°C to +125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - XX percent 4/

intended Use: