Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters
|Publication Date:||1 September 2005|
|ICS Code (Immunity):||33.100.20|
|ICS Code (Emission):||33.100.10|
This part of IEC 61000 provides a basic description of the methods and means (e.g., instrumentation) for measuring responses arising from highpower transient electromagnetic parameters. These responses can include:
- the electric (E) and/or magnetic (H) fields (e.g., incident fields or incident plus scattered fields within a system under test);
- the current I (e.g., induced by a transient field or within a system under test);
- the voltage V (e.g., induced by a transient field or within a system under test);
- the charge Q induced on a cable or other conductor. NOTE The charge Q on the conductor is a fundamental quantity that can be defined at any frequency. The voltage V, however, is a defined (e.g., secondary) quantity, which is valid only at low frequencies. At high frequencies, the voltage cannot be defined as the line integral of the Efield, since this integral is pathdependent. Thus, for very fast rising pulses (having a large highfrequency spectral content) the use of the voltage as a measurement observable is not valid. In this case, the charge is the desired quantity to be measured.
These measured quantities are generally complicated timedependent waveforms, which can be described approximately by several scalar parameters, or "observables". These parameters include:
- the peak amplitude of the response,
- the waveform risetime,
- the waveform falltime (or duration),
- the pulse width, and
- mathematically defined norms obtained from the waveform.
This International Standard provides information on the measurement of these waveforms and on the mathematical determination of the characterizing parameters. It does not provide information on specific level requirements for testing.