AIIM MS9
Method for Measuring Thickness of Buildup Area on Unitized Microfilm Carriers (Aperture, Camera, Copy, and Image Cards)
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| Organization: | AIIM |
| Publication Date: | 1 January 1987 |
| Status: | active |
| Page Count: | 9 |
Document History
AIIM MS9
January 1, 1987
Method for Measuring Thickness of Buildup Area on Unitized Microfilm Carriers (Aperture, Camera, Copy, and Image Cards)
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