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DIN EN 62047-20

Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (IEC 62047-20:2014); German version EN 62047-20:2014

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Organization: DIN
Publication Date: 1 April 2015
Status: active
Page Count: 55
ICS Code (Semiconductor devices in general): 31.080.01
scope:

In diesem Teil der IEC 62047 sind Begriffe, Bemessungen und Kenngrößen sowie Messverfahren für Gyroskope (Drehratensensoren) festgelegt.

Gyroskope werden hauptsächlich in Anwendungen für Endverbraucher, der allgemeinen Industrie und der Luftfahrt eingesetzt. Bauteile der Mikrosystemtechnik (MEMS; en: micro electro mechanical system) und Halbleiterlaser-Bauteile werden weitverbreitet für die Bauelementetechnologie von Gyroskopen verwendet.

Nachfolgend wird Gyro als Benennung für das Gyroskop verwendet.N1)

N1) Nationale Fußnote: Betrifft nicht die deutsche Sprache.

Document History

DIN EN 62047-20
April 1, 2015
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (IEC 62047-20:2014); German version EN 62047-20:2014
In diesem Teil der IEC 62047 sind Begriffe, Bemessungen und Kenngrößen sowie Messverfahren für Gyroskope (Drehratensensoren) festgelegt. Gyroskope werden hauptsächlich in Anwendungen für...
DIN EN 62047-20
July 1, 2012
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (IEC 47F/122/CD:2012)
A description is not available for this item.

References

This document references:
IEEE 952 - Specifying and Testing Single-Axis Interferometric Fiber Optic Gyros
Published by IEEE on September 24, 2020
This standard defines requirements and test procedures for a single-axis interferometric fiber optic gyro (IFOG), including any necessary electronics, to be used in an attitude control system, an...
This document references:
IPC/JEDEC J-STD-020F - Moisture/Reflow Sensitivity Classification for Non-hermetic Surface Mount Devices (SMDs)
Published by IPC on December 1, 2022
This classification procedure applies to all non-hermetic SMDs, which, because of absorbed moisture, could be sensitive to damage during solder reflow. The term SMD as used in this document means...
This document references:
ISO 16063-15 - Methods for the calibration of vibration and shock transducers Part 15: Primary angular vibration calibration by laser interferometry
Published by ISO on August 1, 2006
A description is not available for this item.
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