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NPFC - MIL-STD-202-306

TEST METHOD STANDARD METHOD 306, QUALITY FACTOR (Q)

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Organization: NPFC
Publication Date: 18 April 2015
Status: active
Page Count: 5
scope:

Purpose.

The purpose of this test is to measure the quality factor, commonly called Q, of electronic parts such as capacitors and inductors. By definition, the factor Q expresses the ratio of reactance to effective resistance of a circuit element. This numerical ratio is considered a "figure of merit" for a reactive component (or a resonant circuit utilizing such components) as it is a measure of the ability of the component (or circuit) to store energy compared to the energy it wastes. For this reason, Q is called "storage factor". Q is thus equal to the inverse of the dissipation factor. Relationship also exists between Q and the properties of a tuned circuit, such as the resonant rise in voltage phenomena. Each of the relationships involving Q mentioned above can be applied to the direct or indirect measurement of Q.

Document History

January 22, 2020
Method 306, Quality Factor (Q)
A description is not available for this item.
MIL-STD-202-306
April 18, 2015
TEST METHOD STANDARD METHOD 306, QUALITY FACTOR (Q)
Purpose. The purpose of this test is to measure the quality factor, commonly called Q, of electronic parts such as capacitors and inductors. By definition, the factor Q expresses the ratio of...

References

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