DIN EN 60749-35
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006
active, Most Current
| Organization: | DIN |
| Publication Date: | 1 March 2007 |
| Status: | active |
| Page Count: | 21 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-35
March 1, 2007
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006
A description is not available for this item.