DIN EN 60749-4
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 June 2016 |
| Status: | inactive |
| Page Count: | 16 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-4
June 1, 2016
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
A description is not available for this item.