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SAE J2052

Test Device Head Contact Duration Analysis

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Organization: SAE
Publication Date: 1 July 2016
Status: active
Page Count: 7
scope:

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

Purpose

The purpose of this SAE Information Report is to describe a computer-adaptable technique for determining head engagement and disengagement times for use in the calculation of the HIC without reliance on contact switches or photography.

Document History

SAE J2052
July 1, 2016
Test Device Head Contact Duration Analysis
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. Purpose The...
January 1, 2011
Test Device Head Contact Duration Analysis
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. Purpose The...
December 1, 1997
Test Device Head Contact Duration Analysis
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. Purpose The...
December 1, 1997
(R) Test Device Head Contact Duration Analysis
1. Scope--This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. 1.1...
March 16, 1990
Test Device Head Contact Duration Analysis, Information Report
A description is not available for this item.

References

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