BSI - BS ISO 16700
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
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| Organization: | BSI |
| Publication Date: | 31 July 2016 |
| Status: | active |
| Page Count: | 30 |
| ICS Code (Optical equipment): | 37.020 |
Document History
BS ISO 16700
July 31, 2016
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
A description is not available for this item.
September 29, 2004
Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification
A description is not available for this item.