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IEC 60679-1

Quartz crystal controlled oscillators of assessed quality – Part 1: Generic specification

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Organization: IEC
Publication Date: 1 April 2007
Status: inactive
Page Count: 86
ICS Code (Piezoelectric devices): 31.140

Document History

IEC 60679-1
July 1, 2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality – Part 1: Generic specification IEC
This part of IEC 60679 specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR...
IEC 60679-1
April 1, 2007
Quartz crystal controlled oscillators of assessed quality – Part 1: Generic specification
A description is not available for this item.
IEC 60679-1
December 1, 1997
Quartz Crystal Controlled Oscillators of Assessed Quality - Part 1: Generic Specification
A description is not available for this item.
IEC 60679-1
December 1, 1997
Quartz Crystal Controlled Oscillators of Assessed Quality - Part 1: Generic Specification
A description is not available for this item.
60679-1
December 1, 1997
Quartz Crystal Controlled Oscillators of Assessed Quality - Part 1: Generic Specification
A description is not available for this item.
IEC 60679-1
January 1, 1980
Quartz Crystal Controlled Oscillators Part 1: General Information, Test Conditions and Methods (Amendment 1-1985)
A description is not available for this item.
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References

This document is referenced by:
EN 60679-6 - Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
Published by CENELEC on April 1, 2011
This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows...
This document is referenced by:
CEI EN IEC 61837-2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections Part 2: Ceramic enclosures
Published by CEI on January 1, 2021
A description is not available for this item.
This document is referenced by:
IEC 60679-3 - Quartz crystal controlled oscillators of assessed quality – Part 3: Standard outlines and lead connections
Published by IEC on December 1, 2012
This part of IEC 60679 specifies the outline dimensions and lead connections for quartz crystal controlled oscillators with lead enclosures.
This document is referenced by:
IEC 60747-16-5 - Semiconductor devices – Part 16-5: Microwave integrated circuits – Oscillators
Published by IEC on July 1, 2020
This part of IEC 60747 specifies the terminology, essential ratings and characteristics, and measuring methods of microwave integrated circuit oscillators. This standard is applicable to the fixed...
This document is referenced by:
BS EN 61837-1 - Surface Mounted Piezoelectric Devices for Frequency Control and Selection - Standard Outlines and Terminal Lead Connections - Part 1: Plastic Moulded Enclosure Outlines
Published by BSI on September 30, 2012
A description is not available for this item.
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