UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Webinars & White Papers

IEC - 62276

Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods

active, Most Current
Organization: IEC
Publication Date: 1 October 2016
Status: active
Page Count: 44
ICS Code (Piezoelectric devices): 31.140
scope:

This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

Document History

62276
October 1, 2016
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
October 1, 2012
Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
May 1, 2005
Single crystal wafers for surface acoustic wave (SAW) device applications Specifications and measuring methods
A description is not available for this item.
August 1, 2001
Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method
A description is not available for this item.

References

Advertisement