UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

VDI/VDE/DGQ/DKD 2622 BLATT 23.1

Calibration of measuring equipment for electrical quantities - Clamp-on probes (DC and NF-AC)

active
Organization: VDI
Publication Date: 1 February 2017
Status: active
Page Count: 13
ICS Code (Measurement of electrical and magnetic quantities): 17.220.20
scope:

The present standard provides universally applicable procedures for calibrating measuring equipment for electrical quantities and thereby creates a uniform basis for test equipment monitoring which can be used across different companies.

This standard applies to the calibration of clamp-on probes for DC and AC current in the 0 Hz to 10 kHz frequency range.

The procedures described are applicable to clampon probes. These include both clamp-on ammeters and current clamps with an external measuring instrument for displaying measured values. This standard makes no claim to cover fully all metrological aspects of current clamps - not even those important to calibration. This standard does not deal with the calibration of clamp-on probes for oscilloscopes.

This standard is applicable in conjunction with VDI/VDE/DGQ/DKD 2622 Part 1 and Part 2.

Document History

Calibration of measuring equipment for electrical quantities - Clamp-on probes (DC and NF-AC) - Corrigendum concerning standard VDI/VDE/DGQ/DKD 2622 Part 23.1:2017-02
A description is not available for this item.
VDI/VDE/DGQ/DKD 2622 BLATT 23.1
February 1, 2017
Calibration of measuring equipment for electrical quantities - Clamp-on probes (DC and NF-AC)
The present standard provides universally applicable procedures for calibrating measuring equipment for electrical quantities and thereby creates a uniform basis for test equipment monitoring which...

References

Advertisement