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IEC 62374

Semiconductor devices – Time dependent dielectric breakdown (TDDB) test for gate dielectric films

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Organization: IEC
Publication Date: 1 March 2007
Status: active
Page Count: 46
ICS Code (Semiconductor devices): 31.080

Document History

IEC 62374
March 1, 2007
Semiconductor devices – Time dependent dielectric breakdown (TDDB) test for gate dielectric films
A description is not available for this item.

References

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