BSI - BS EN 60749-28
Semiconductor devices - Mechanical and climatic test methods Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
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| Organization: | BSI |
| Publication Date: | 31 July 2017 |
| Status: | active |
| Page Count: | 50 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
September 30, 2022
Semiconductor devices - Mechanical and climatic test methods Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
A description is not available for this item.
BS EN 60749-28
July 31, 2017
Semiconductor devices - Mechanical and climatic test methods Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
A description is not available for this item.