IEEE 1149.10

High-Speed Test Access Port and On-Chip Distribution Architecture

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Organization: IEEE
Publication Date: 18 May 2017
Status: active
Page Count: 96
scope:

This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures.

The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible.

The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.

 

Document History

IEEE 1149.10
May 18, 2017
High-Speed Test Access Port and On-Chip Distribution Architecture
This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from...

References

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