IEC 62979

Photovoltaic modules – Bypass diode – Thermal runaway test

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Organization: IEC
Publication Date: 1 August 2017
Status: active
Page Count: 18
ICS Code (Solar energy engineering): 27.160
scope:

This document provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.

This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.

The test specimens which employ P/N diodes as bypass diodes are exempted from the thermal runaway test required herein, because the capability of P/N diodes to withstand the reverse bias is sufficiently high.

Document History

IEC 62979
August 1, 2017
Photovoltaic modules – Bypass diode – Thermal runaway test
This document provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition...

References

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