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IEC - 62396-2

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

active, Most Current
Organization: IEC
Publication Date: 1 December 2017
Status: active
Page Count: 46
ICS Code (Production. Production management): 03.100.50
ICS Code (Electronic components in general): 31.020
ICS Code (Aerospace electric equipment and systems): 49.060
scope:

This part of IEC 62396 aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth's atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes.

Although developed for the avionics industry, this process can be applied by other industrial sectors.

Document History

62396-2
December 1, 2017
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
This part of IEC 62396 aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons...
September 1, 2012
Process management for avionics – Atmospheric radiation effects – Part 2: Guidelines for single event effects testing for avionics systems
This part of IEC 62396 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric...
August 1, 2008
Process management for avionics – Atmospheric radiation effects – Part 2: Guidelines for single event effects testing for avionics systems
The purpose of this technical specification is to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE)...
September 1, 2007
Process management for avionics – Atmospheric radiation effects – Part 2: Guidelines for single event effects testing for avionics systems
A description is not available for this item.

References

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