DIN EN 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 April 2017 |
| Status: | inactive |
| Page Count: | 35 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-41
April 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016)
A description is not available for this item.