DIN EN 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016)
inactive, Most Current
Organization: | DIN |
Publication Date: | 1 April 2017 |
Status: | inactive |
Page Count: | 35 |
ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-41
April 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016)
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