CRC - 1737
Memory, Microprocessor, and ASIC
| Organization: | CRC |
| Publication Date: | 26 March 2003 |
| Status: | active |
| Page Count: | 386 |
scope:
Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific
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