DIN EN 60749-13
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 47/2377/CDV:2017); German version prEN 60749-13:2017
inactive
| Organization: | DIN |
| Publication Date: | 1 July 2017 |
| Status: | inactive |
| Page Count: | 24 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-13
July 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 47/2377/CDV:2017); German version prEN 60749-13:2017
A description is not available for this item.
April 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2002); German version EN 60749-13:2002
A description is not available for this item.