TSE - TS EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
active
| Organization: | TSE |
| Publication Date: | 21 December 2006 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
June 12, 2013
Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
A description is not available for this item.
TS EN 60749-27
December 21, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
A description is not available for this item.