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TSE - TS EN 60749-21

Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability

inactive
Organization: TSE
Publication Date: 22 November 2011
Status: inactive
ICS Code (Semiconductor devices in general): 31.080.01
scope:

Bu standard, tutturmak icin kalay kursun (SnPb) veya kursunsuz(Pb olmayan) lehim kullanilarak baska bir yuzeyle birlestirilmesion gorulen eleman paketi baglanti uclarinin lehimlenebilirliginibelirlemek icin standard bir islemi kapsar.

Document History

January 31, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
A description is not available for this item.
TS EN 60749-21
November 22, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Bu standard, tutturmak icin kalay kursun (SnPb) veya kursunsuz(Pb olmayan) lehim kullanilarak baska bir yuzeyle birlestirilmesion gorulen eleman paketi baglanti uclarinin...
January 17, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
This standard applies to ceramic tile grouts for internal and external tile installations on walls and floors.
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