TSE - TS EN 60749-40
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
active, Most Current
| Organization: | TSE |
| Publication Date: | 21 February 2012 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
TS EN 60749-40
February 21, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
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