TSE - TS EN 60749-42
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
active, Most Current
| Organization: | TSE |
| Publication Date: | 24 December 2014 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 provides a test method to evaluate theendurance of semiconductor devices used in high temperature andhigh humidity environments.
Document History
TS EN 60749-42
December 24, 2014
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
This part of IEC 60749 provides a test method to evaluate theendurance of semiconductor devices used in high temperature andhigh humidity environments.