UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

TSE - TS EN 60444-8

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

active, Most Current
Organization: TSE
Publication Date: 29 March 2011
Status: active
ICS Code (Piezoelectric devices): 31.140
scope:

Bu standard, IEC 60444-4 ve IEC 60444-5?te belirtilen sifir fazteknigini kullanarak, yuzey monteli ucsuz kuvartz kristalbirimlerinin rezonans frekansinin, rezonans direnci ve esdegerelektrik devre parametrelerinin hassas olarak olculmesine izinveren deney duzenegini kapsar

Document History

TS EN 60444-8
March 29, 2011
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Bu standard, IEC 60444-4 ve IEC 60444-5?te belirtilen sifir fazteknigini kullanarak, yuzey monteli ucsuz kuvartz kristalbirimlerinin rezonans frekansinin, rezonans direnci ve esdegerelektrik devre...
December 2, 2004
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003) / Note: Endorsement notice
Bu standard, her biri 10 J’u aşmayan kinetik enerjili, metal olmayan sicim kesme elemanlı veya mil üzerinde serbestçe dönen metal olmayan kesicili, şebeke gerilimiyle çalışan, ayakta duran bir...
Advertisement