TSE - TS EN 175301-801
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors
active, Most Current
| Organization: | TSE |
| Publication Date: | 21 December 2006 |
| Status: | active |
| ICS Code (Plug-and-socket devices. Connectors): | 31.220.10 |
Document History
TS EN 175301-801
December 21, 2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors
A description is not available for this item.
March 23, 2006
Detail specification: High density rectangular connectors, round removable crimp contacts
Bu standard yuksek yogunluklu kare bicimli, yuvarlak,sokulebilir sikistirmali temas uclu baglayicilar icin taslak-detayozelligi standardini kapsar.
November 21, 2000
Detail specification: High density rectangular connectors, round removable crimp contacts
A description is not available for this item.