TSE - TS EN 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
inactive
| Organization: | TSE |
| Publication Date: | 19 January 2010 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Bu standard tumlesik devrelerin I-deney ve asiri gerilimkilitleme deneyini kapsar.
Document History
January 31, 2012
Semiconductor devices - Mechanical and climatic test methods -Part 29: Latch-up test
A description is not available for this item.
TS EN 60749-29
January 19, 2010
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Bu standard tumlesik devrelerin I-deney ve asiri gerilimkilitleme deneyini kapsar.
December 2, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2003) / Note: Endorsement notice. Corrected and reprinted in 2004-03
A description is not available for this item.