TSE - TS EN 60749-34
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
active, Most Current
| Organization: | TSE |
| Publication Date: | 5 June 2012 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
TS EN 60749-34
June 5, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
A description is not available for this item.
April 30, 2008
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Bu standard, ic yari iletkenler ve ic baglayicilardaki cevrimliguc tuketimi nedeniyle bir yari iletken elemanin isil ve mekanikzorlamaya dayanikliligini tayin etmek icin kullanilan deneymetodunu...
December 2, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2004)
Bu standard, her biri 10 J’u aşmayan kinetik enerjili, metal olmayan sicim kesme elemanlı veya mil üzerinde serbestçe dönen metal olmayan kesicili, şebeke gerilimiyle çalışan, ayakta duran bir...