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TSE - TS EN 60191-6-19

Mechanical standardization of semiconductor devices - Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage

active, Most Current
Organization: TSE
Publication Date: 13 July 2010
Status: active
ICS Code (Mechanical structures for electronic equipment): 31.240

Document History

TS EN 60191-6-19
July 13, 2010
Mechanical standardization of semiconductor devices - Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
A description is not available for this item.
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