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TSE - TS EN 61189-3-719

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3-719: Test methods for interconnection structures (printed boards) - Monitoring of single plated-through hole (PTH) resistance change during temperature cycling

active, Most Current
Organization: TSE
Publication Date: 9 December 2016
Status: active
ICS Code (Printed circuits and boards): 31.180
scope:

This part of IEC 61189 specifies a test method to monitor theresistance of single platedthrough holes (PTHs) in printed circuitboards (PCBs) to determine the PTH durability underthermo-mechanical stress induced by temperature cycling.

Document History

TS EN 61189-3-719
December 9, 2016
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3-719: Test methods for interconnection structures (printed boards) - Monitoring of single plated-through hole (PTH) resistance change during temperature cycling
This part of IEC 61189 specifies a test method to monitor theresistance of single platedthrough holes (PTHs) in printed circuitboards (PCBs) to determine the PTH durability underthermo-mechanical...
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