scope:

This International Standard specifies a method of measurementand associated test conditions to assess the "noisiness", ormagnitude of current noise, generated in fixed resistors of anygiven type. The method applies to all classes of fixed resistors.The aim is to provide comparable results for the determination ofthe suitability of resistors for use in electronic circuits havingcritical noise requirements. The current noise in resistivematerials reflects the granular structure of the resistivematerial. For some resistor technologies utilizing homogenouslayers it is regarded as providing an indication of defects, whichare considered as a root cause for abnormal ageing of the componentunder the influence of temperature and time. The method describedin this International Standard is not a general specificationrequirement and therefore is applied if prescribed by a relevantcomponent specification, or, if agreed between a customer and amanufacturer.