ETSI - TR 126 954
LTE; Test plan for speech quality and delay through a headset electrical interface
inactive
| Organization: | ETSI |
| Publication Date: | 1 July 2017 |
| Status: | inactive |
| Page Count: | 23 |
scope:
The present document provides guidance on testing of speech quality and delay through a UE headset electrical interface, including both analog and digital headset interfaces. The present document includes test set-up configurations, measurement scenarios and an indication of a range of results that can be expected in measurements. It is envisioned that the present document will serve as a reference for UE vendors and Mobile Network Operators wishing to conduct such tests.
Document History
May 1, 2022
LTE; 5G; Test plan for speech quality and delay through a headset electrical interface
The present document provides guidance on testing of speech quality and delay through a UE headset electrical interface, including both analog and digital headset interfaces. The present document...
September 1, 2020
LTE; Test plan for speech quality and delay through a headset electrical interface
The present document provides guidance on testing of speech quality and delay through a UE headset electrical interface, including both analog and digital headset interfaces. The present document...
July 1, 2018
LTE; Test plan for speech quality and delay through a headset electrical interface
The present document provides guidance on testing of speech quality and delay through a UE headset electrical interface, including both analog and digital headset interfaces. The present document...
TR 126 954
July 1, 2017
LTE; Test plan for speech quality and delay through a headset electrical interface
The present document provides guidance on testing of speech quality and delay through a UE headset electrical interface, including both analog and digital headset interfaces. The present document...