VDE 0884-749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017
active, Most Current
| Organization: | VDE |
| Publication Date: | 1 February 2018 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
VDE 0884-749-28
February 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017); German version EN 60749-28:2017
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