CEI EN 61189-5-503
Test methods for electrical materials, printed board and other interconnection structures and assemblies Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
|Publication Date:||1 December 2017|
|ICS Code (Printed circuits and boards):||31.180|
This part of IEC 61189 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperaturehumidity cyclic test and an unsaturated pressurized vapour test (HAST).