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BSI - BS EN IEC 63041-1

Piezoelectric sensors Part 1: Generic specifications

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Organization: BSI
Publication Date: 31 March 2018
Status: active
Page Count: 28
ICS Code (Piezoelectric devices): 31.140

Document History

BS EN IEC 63041-1
November 30, 2021
Piezoelectric sensors Part 1: Generic specifications
A description is not available for this item.
BS EN IEC 63041-1
March 31, 2018
Piezoelectric sensors Part 1: Generic specifications
A description is not available for this item.

References

This document references:
EN 60444-9 - Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
Published by CENELEC on April 1, 2007
A description is not available for this item.
This document references:
IEC 60689 - Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Published by IEC on November 1, 2008
A description is not available for this item.
This document references:
EN 60689 - Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Published by CENELEC on March 1, 2009
A description is not available for this item.
This document references:
IEC 62276 - Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
Published by IEC on October 1, 2016
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
This document references:
EN 60122-1 - Quartz crystal units of assessed quality Part 1: Generic specification
Published by CENELEC on December 1, 2002
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This document references:
IEC 60689 - Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Published by IEC on November 1, 2008
A description is not available for this item.
This document references:
EN 60689 - Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Published by CENELEC on March 1, 2009
A description is not available for this item.
This document references:
EN 60444-9 - Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
Published by CENELEC on April 1, 2007
A description is not available for this item.
This document references:
EN 60122-1 - Quartz crystal units of assessed quality Part 1: Generic specification
Published by CENELEC on December 1, 2002
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
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