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BSI - BS EN IEC 63041-1

Piezoelectric sensors Part 1: Generic specifications

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Organization: BSI
Publication Date: 31 March 2018
Status: active
Page Count: 28
ICS Code (Piezoelectric devices): 31.140

Document History

20/30427457 DC
September 25, 2020
Draft BS EN IEC 63041-1 Piezoelectric sensors. Part 1: Generic specifications
A description is not available for this item.
20/30405239 DC
May 12, 2020
Draft BS EN 63041-1 Ed.2.0 Piezoelectric sensors. Part 1: Generic specifications
A description is not available for this item.
BS EN IEC 63041-1
March 31, 2018
Piezoelectric sensors Part 1: Generic specifications
A description is not available for this item.

References

This document references:
EN 61240 - Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
Published by CENELEC on January 1, 2017
This International Standard sets out general rules for drawing all dimensional and geometrical characteristics of a surface-mounted piezoelectric device package (referred to in this document as SMD)...
This document references:
EN 60122-1 - Quartz crystal units of assessed quality Part 1: Generic specification
Published by CENELEC on December 1, 2002
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This document references:
EN 60444-1 - Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network
Published by CENELEC on April 1, 1997
A description is not available for this item.
This document references:
EN 60444-5 - Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
Published by CENELEC on April 1, 1997
A description is not available for this item.
This document references:
EN 60444-9 - Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
Published by CENELEC on April 1, 2007
A description is not available for this item.
This document references:
EN 61240 - Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
Published by CENELEC on January 1, 2017
This International Standard sets out general rules for drawing all dimensional and geometrical characteristics of a surface-mounted piezoelectric device package (referred to in this document as SMD)...
This document references:
EN 60122-1 - Quartz crystal units of assessed quality Part 1: Generic specification
Published by CENELEC on December 1, 2002
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This document references:
EN 60444-9 - Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
Published by CENELEC on April 1, 2007
A description is not available for this item.
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