UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close

Select Your Free Newsletters

Industry Newsletters

Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

BSI - BS EN IEC 63041-2

Piezoelectric sensors Part 2: Chemical and biochemical sensors

active, Most Current
Buy Now
Organization: BSI
Publication Date: 31 March 2018
Status: active
Page Count: 22
ICS Code (Piezoelectric devices): 31.140

Document History

BS EN IEC 63041-2
March 31, 2018
Piezoelectric sensors Part 2: Chemical and biochemical sensors
A description is not available for this item.

References

This document references:
IEC 61240 - Piezoelectric devices – Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection – General rules
Published by IEC on October 1, 2016
This International Standard sets out general rules for drawing all dimensional and geometrical characteristics of a surface-mounted piezoelectric device package (referred to in this document as SMD)...
This document references:
ISO 11843-1 - Capability of Detection - Part 1: Terms and Definitions
Published by ISO on July 1, 1997
A description is not available for this item.
This document references:
IEC 60122-1 - Quartz crystal units of assessed quality – Part 1: Generic specification
Published by IEC on December 1, 2017
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This document references:
IEC 62276 - Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
Published by IEC on October 1, 2016
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
This document references:
EN 60444-5 - Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
Published by CENELEC on April 1, 1997
A description is not available for this item.
This document references:
EN 60444-5 - Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
Published by CENELEC on April 1, 1997
A description is not available for this item.
This document references:
IEC 60122-1 - Quartz crystal units of assessed quality – Part 1: Generic specification
Published by IEC on December 1, 2017
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This document references:
IEC 62276 - Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
Published by IEC on October 1, 2016
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
This document references:
ISO 11843-1 - Capability of Detection - Part 1: Terms and Definitions
Published by ISO on July 1, 1997
A description is not available for this item.
View Less
View All
Advertisement